Deposition of copper, silver and gold from aqueous solutions onto germanium substrates is studied in this work. For this purpose both acidic and alkaline solutions were used. All investigated metals can successfully be deposited via the galvanic displacement reaction. These deposits are porous and with different surface morphologies which depended on the type (p- or n-) of the Ge substrate used in the experiments and on pH. Prolonged times of immersion of Ge substrates into investigated solutions may lead to a formation of more porous coatings and even powders, as successfully demonstrated on the example of silver. It is believed that the approach presented in this work should further be investigated as an activation step for a possible metallization of Ge substrates via autocatalytic or electrodeposition methods.
Source:Electrochimica
Acta
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PWAM offers semiconductor materials,Ge(Germanium) Single Crystals and Wafers grown by VGF / LEC
Jan 13, 2014
Jan 9, 2014
Germanium on insulator near-infrared photodetectors fabricated by layer transfer
We report on novel pn Ge
photodetectors fabricated on glass. The fabrication consists of wafer bonding
and layer splitting, followed by a low-temperature epitaxial growth of Ge. The
photodiodes are characterized in terms of dark current and responsivity, and
their performance compared with devices realized on either Ge or Si. The
minimum current density is 50 μA/cm2 at 1 V
reverse bias, the responsivity is 0.2 A/W in the photovoltaic mode, with a
maximum of 0.28 A/W at 1.55 μm at a reverse voltage of 5 V.
Source:Thin
Solid Films
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photodetectors fabricated by layer transfer, please visit our
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This paper describes the creation of a germanium on sapphire
platform, via wafer bonding technology, for system-on-a-chip applications.
Similar thermal coefficients of expansion between germanium (5.8 × 10−6 K−1)
and sapphire (5 × 10−6 K−1)
make the bonding of germanium to sapphire a reality. Germanium directly bonded
to sapphire results in microvoid generation during post bond annealing.
Inclusion of an interface layer such as silicon dioxide layer by plasma
enhanced chemical vapour deposition, prior to bonding, results in a microvoid
free bond interface after annealing. Grinding and polishing of the subsequent
germanium layer has been achieved leaving a thick germanium on sapphire (GeOS)
substrate. Submicron GeOS layers have also been achieved with hydrogen/helium
co-implantation and layer transfer. Circular geometry transistors exhibiting a
field effect mobility of 890 cm2/V s
have been fabricated onto the thick germanium on sapphire layer.
Source:Solid-State
Electronics
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