The bulk mobility is plotted against the bandgap for silicon, germanium and a variety of group III–V materials. Filled symbols indicate electrons, and open symbols indicate holes. Germanium offers the highest hole mobility of any known…
A cross-sectional scanning electron microscopy image of germanium-on-silicon growth, using the aspect-ratio-trapping process. Scale bar, 0.25 μm. Reproduced, with permission, from ref. STI, shallow-trench isolation.
- Source:Scienece
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