Jul 26, 2017

The impact of polishing on germanium-on-insulator substrates

Abstract

We prepared germanium-on-insulator (GOI) substrates by using Smart-Cut and wafer bonding technology. The fabricated GOI is appropriate for polishing due to a strong bonding strength (2.4 MPa) and a sufficient bonding quality. We investigated mechanical polishing and chemical—mechanical polishing (CMP) systematically, and an appropriate polishing method—mechanical polishing combined with CMP—is obtained. As shown by AFM measurement, the RMS of GOI after polishing decreased to 0.543 nm. And the Ge peak profile of the XRD curve became symmetric, and the FWHM is about 121.7 arcsec, demonstrating a good crystal quality.
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Jul 19, 2017

A thin transition film formed by plasma exposure contributes to the germanium surface hydrophilicity

Abstract

Plasma treatment and 10% NH4OH solution rinsing were performed on a germanium (Ge) surface. It was found that the Ge surface hydrophilicity after O2 and Ar plasma exposure was stronger than that of samples subjected to N2 plasma exposure. This is because the thin GeO x film formed on Ge by O2 or Ar plasma is more hydrophilic than GeO x N y formed by N2 plasma treatment. A flat (RMS < 0:5 nm) Ge surface with high hydrophilicity (contact angle smaller than 3°) was achieved by O2plasma treatment, showing its promising application in Ge low-temperature direct wafer bonding.
Keywords:germanium wafers,
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Jul 11, 2017

Thin film germanium on silicon created via ion implantation and oxide trapping

Abstract

We present a novel process for integrating germanium with silicon-on-insulator (SOI) wafers. Germanium is implanted into SOI which is then oxidized, trapping the germanium between the two oxide layers (the grown oxide and the buried oxide). With careful control of the implantation and oxidation conditions this process creates a thin layer (current experiments indicate up to 20-30nm) of almost pure germanium. The layer can be used potentially for fabrication of integrated photo-detectors sensitive to infrared wavelengths, or may serve as a seed for further germanium growth. Results are presented from electron microscopy and Rutherford back-scattering analysis, as well as preliminary modelling using an analytical description of the process.
Keywords:germanium,SOI,silicon-on-insulator (SOI),
Source:  iopscience
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Jul 7, 2017

A review of thermal processing in the subsecond range: semiconductors and beyond

Abstract

Thermal processing in the subsecond range comprises modern, non-equilibrium annealing techniques which allow various material modifications at the surface without affecting the bulk. Flash lamp annealing (FLA) is one of the most diverse methods for short-time annealing with applications ranging from the classical field of semiconductor doping to the treatment of polymers and flexible substrates. It still continues to extend its use to other material classes and applications, and is becoming of interest for an increasing number of users. In this review we present a short, but comprehensive and consistent picture of the current state-of-the-art of FLA, sometimes also called pulsed light sintering. In the first part we take a closer look at the physical and technological background, namely the electrical and optical specifications of flash lamps, the resulting temperature profiles, and the corresponding implications for process-relevant parameters such as reproducibility and homogeneity. The second part briefly considers the various applications of FLA, starting with the classical task of defect minimization and ultra-shallow junction formation in Si, followed by further applications in Si technology, namely in the fields of hyperdoping, crystallization of thin amorphous films, and photovoltaics. Subsequent chapters cover the topics of doping and crystallization in Ge and silicon carbide, doping of III–V semiconductors, diluted magnetic semiconductors, III–V nanocluster synthesis in Si, annealing of transparent conductive oxides and high-k materials, nanoclusters in dielectric matrices, and the use of FLA for flexible substrates.
Keywords:FLA,
Source:  iopscience
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